By submitting your request you agree to the processing of your data for the purpose of processing your request.
Data Protection Declaration and Revocation Notices
As electronic devices become smaller and denser, electro-chemical migration evaluation and insulation evaluation have become more important. Electrochemical migration (ECM) can result in the growth of a metal deposit from cathode to anode. It could happen on both the surface and inside of PCBs. In electronics, such growth can lead to a short-circuit by bridging the electrodes, potentially leading to intermittent or complete failure of electronic devices.
The Espec Electro Chemical Migration system enables accurate and efficient evaluation of insulation resistance and life evaluation when electro-chemical migration occurs. It has various applications, from low voltage testing to high voltage testing. AMI captures not only gradual change in resistance but also an unexpected rapid drop.
Detects decline of insulation resistance by continuous measurement while applying voltage under high-temperature, high-humidity conditions.
Up to 4 environmental test chambers can be connected and tests performed. In addition to the resistance and voltage values, linking with an environmental test chamber allows the temperature and humidity in the test area to be monitored on the AMI.
The leak-touch detection function detects the occurrence of ion migration in microsecond intervals. It immediately shuts off stress voltage to the channel when leak-touch is detected. You may choose whether to continue testing after detection.
Measurement over a wide range of 1 x 106 to 3 x 1013 Ω at end of the 3m measurement cable (for AMI-025-P).
One channel with one power supply guarantees no effect of voltage drop by leak on other channels. Each channel has an individual voltage monitor to ensure the correct voltage is applied to each channel.
An ESPEC designed scanner guarantees “no interruption of voltage supply” from stress to measurement.
| Resistance measurement range (Ω) |
2.0 × 105 to 1.0 × 1013 (when 100 V is applied) 2.0 × 103 to 1.0 × 1011 (when 1 V is applied) |
|---|---|
| Channel configuration | 5ch, 25ch |
| Measurement voltage | DC1.0 to 100V (0.1V increments) |
| Leak touch detection speed | Constant detection at less than 100 µsec |
By submitting your request you agree to the processing of your data for the purpose of processing your request.
Data Protection Declaration and Revocation Notices